Dissociation of molecules on silicon surfaces studied by scanning tunneling microscopy
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Date
2007
Authors
Maraghechi, Pouya
University of Lethbridge. Faculty of Arts and Science
Journal Title
Journal ISSN
Volume Title
Publisher
Lethbridge, Alta. : University of Lethbridge, Faculty of Arts and Science, 2007
Abstract
Dissociation of trichloroethylene (TCE) molecules on the Si(111)-7x7 and the Si(100)-2x1 surfaces was studied using STM. Though molecular adsorption may also be observed on the Si(111)-7x7 surface, dissociation is the dominant process. From the STM images acquired, products of dissociation were identified, namely chlorine atoms and dichlorovinyl groups. Dissociation of chlorine from the TCE molecule was confirmed by studying not just appearance in STM images but also from studies of tip-induced diffusion. Different binding configurations were proposed for the vinyl group on the Si (111)-7x7 and the Si(100)-2x1 surfaces. Site preference for each product of dissociation is reported on the Si(111)-7x7 surface. Dissociation of molecules such as ammonia, dimethylamine and methyl chloride on the Si(111)-7x7 and Si(100)-2x1 surfaces is reviewed. The field emission process is explained in detail. The usefulness of making field emission measurements is in evaluating the sharpness of STM tips.
Description
xviii, 175 leaves : ill. (some col.) ; 29 cm
Keywords
Dissociation , Scanning tunneling microscopy , Silicon -- Surfaces , Surfaces (Physics) -- Research , Trichloroethylene -- Adsorption and absorption , Dissertations, Academic